Microstructural characterization of Bombyx mori silk fibers

Macromolecules

Volumn 31, Issue 25, 1998, Pages 8857-8864

  Shen, Yu ^a   Johnson, Michael A ^a   Martin, David C ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; EXTRUSION; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

LOW-VOLTAGE HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPY (LVHRSEM); SELECTED AREA DIFFRACTION (SAED); WIDE-ANGLE X RAY SCATTERING (WAXS);

SILK;

EID: 0032289250     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma980281j     Document Type: Article

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