Subnanometer hole properties of CO2-exposed polysulfone studied by positron annihilation lifetime spectroscopy

Journal of Polymer Science, Part B: Polymer Physics

Volumn 36, Issue 17, 1998, Pages 3049-3056

  Yuan, J P ^a   Cao, H ^a   Hellmuth, E W ^a   Jean, Y C ^a  

^a UNIVERSITY OF MISSOURI KANSAS CITY   (United States)

Author keywords

CO2 gas exposure; Free volume; Polysulfone; Positron annihilation

Indexed keywords

CARBON DIOXIDE; DESORPTION; HYDROSTATIC PRESSURE; HYSTERESIS; MICROSTRUCTURE; PRESSURE EFFECTS; SPECTROSCOPIC ANALYSIS;

PLASTICIZATION; POSITRON ANNIHILATION LIFETIME SPECTROSCOPY (PALS);

POLYSULFONES;

EID: 0032289121     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-0488(199812)36:17<3049::AID-POLB5>3.0.CO;2-O     Document Type: Article

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