Borrmann-effect topography of thick potassium dihydrogen phosphate (KDP) crystals

Crystal Research and Technology

Volumn 33, Issue 4, 1998, Pages 605-611

  Klapper, H ^a   Smolsky, I L ^b,c  

^a UNIVERSITY OF BONN   (Germany)

^b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^c RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC WAVE TRANSMISSION; LIGHT ABSORPTION; PHOTOELECTRICITY; POTASSIUM COMPOUNDS; X RAY CRYSTALLOGRAPHY;

BORRMANN EFFECT; PHOTOELECTRIC ABSORPTION DENSITY; POTASSIUM DIHYDROGEN PHOSPHATE; X RAY DIFFRACTION TOPOGRAPHY;

SINGLE CRYSTALS;

EID: 0032288862     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-4079(1998)33:4<605::aid-crat605>3.0.co;2-5     Document Type: Article

References (4)

1. ANDO, Y., KATO, N.: J. Appl. Crystallogr. 3 (1970) 74
2. BATTERMANN, B. W., COLE, H.: Dynamical diffraction of X-rays by perfect crystals. Rev. Mod. Physics 36 (1964) 681
3. BORRMANN, G.: Z. Phys. 127 (1950) 297-323
4. BORRMANN, G.: Z Krist. 106 (1954) 109-121