X-ray diffraction tomography using interference effects

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 418, Issue 2-3, 1998, Pages 458-464

  Barroso, R C ^a   Lopes, R T ^b   Goncalves O D ^b   De Assis, J T ^a  

^a STATE UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^b FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

Coherent scattering; Computed tomography; Interference; Tomographic image; X ray diffraction

Indexed keywords

COPPER; LEAD; LIGHT INTERFERENCE; PHOTOELECTRICITY; POLYCRYSTALLINE MATERIALS; SILVER; X RAY DIFFRACTION ANALYSIS; X RAY RADIOGRAPHY; X RAY SCATTERING;

BRAGG ANGLE; X RAY DIFFRACTION TOMOGRAPHY;

COMPUTERIZED TOMOGRAPHY;

EID: 0032287397     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)00759-1     Document Type: Article

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