Characterization of electromechanical properties of relaxor-PT piezoelectric single crystals

Proceedings of the IEEE Ultrasonics Symposium

Volumn 1, Issue , 1998, Pages 571-574

  Geng, Xuecang ^a   Ritter, T A ^a   Park, S E ^a  

^a Blatek Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; INTERFEROMETRY; LASER APPLICATIONS; MECHANICAL PROPERTIES; PERMITTIVITY MEASUREMENT; PIEZOELECTRICITY; SINGLE CRYSTALS;

ELECTROMECHANICAL COEFFICIENT;

PIEZOELECTRIC MATERIALS;

EID: 0032286970     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)