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Volumn , Issue , 1998, Pages 55-58
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Properties of Sr2Nb2O7 family ferroelectric thin films
a
a
ROHM CO LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CAPACITORS;
CURRENT VOLTAGE CHARACTERISTICS;
FERROELECTRIC MATERIALS;
FERROELECTRICITY;
INTERDIFFUSION (SOLIDS);
POLYCRYSTALLINE MATERIALS;
RANDOM ACCESS STORAGE;
SECONDARY ION MASS SPECTROMETRY;
SEMICONDUCTING LEAD COMPOUNDS;
SEMICONDUCTING SILICON;
STRONTIUM COMPOUNDS;
FLOATING GATE FERROELECTRIC RANDOM ACCESS MEMORY (FFRAM);
METAL FERROELECTRIC METAL INSULATOR SEMICONDUCTOR (MFMIS) STRUCTURES;
DIELECTRIC FILMS;
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EID: 0032286724
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
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Times cited : (2)
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References (6)
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