메뉴 건너뛰기





Volumn 2, Issue , 1998, Pages 1269-1272

Optical heterodyne force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; HETERODYNING; IMAGE ANALYSIS; OPTICAL MICROSCOPY; PROBES; THERMOELASTICITY; ULTRASONIC IMAGING; VIBRATIONS (MECHANICAL);

EID: 0032283774     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (4)

References (29)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.