Effects of Relativistic Frequency Down-Shift and Optical Thickness on Measurements of Electron Temperature Profile from Electron Cyclotron Emission in Medium Temperature Tokamak Plasmas

Journal of the Physical Society of Japan

Volumn 67, Issue 9, 1998, Pages 3090-3099

  Sato, Masayasu ^a   Isei, Nobuaki ^a   Ishida, Shinichi ^a   Isayama, Akihiko ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Electron cyclotron emission; Electron temperature profile; Optical thickness; Plasma diagnostics; The relativistic frequency down shift; Tokamak

Indexed keywords

EID: 0032282884     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.67.3090     Document Type: Article

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