|
|
|
Volumn , Issue , 1998, Pages 113-116
|
|
Breakdown mechanism in insulating zinc oxide film
a
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
CAPACITANCE;
DIELECTRIC PROPERTIES OF SOLIDS;
ELECTRIC BREAKDOWN OF SOLIDS;
ELECTRIC CONDUCTANCE;
ELECTRIC INSULATING MATERIALS;
METALLIZING;
SEMICONDUCTING FILMS;
SEMICONDUCTING ZINC COMPOUNDS;
SUBSTRATES;
THIN FILMS;
CAPACITANCE VOLTAGE CHARACTERISTICS;
CONDUCTANCE VOLTAGE CHARACTERISTICS;
DIELECTRIC FILMS;
|
|
EID: 0032281881
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
|
Times cited : (5)
|
|
References (7)
|
