Sensitivity study of interconnect variation using statistical experimental design

International Workshop on Statistical Metrology, Proceedings, IWSM

Volumn , Issue , 1998, Pages 68-71

  Lin, Zhihao Jeff ^a   Spanos, Costas J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SENSITIVITY ANALYSIS; STATISTICAL TESTS;

MULTIPLIER CIRCUITS;

MULTIPLYING CIRCUITS;

EID: 0032279639     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)