Monte Carlo simulation of hot-carrier degradation in scaled MOS transistors for VLSI technology

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1998, Pages 893-896

  Ghetti, Andrea ^a   Bude, Jeff ^a   Liu, C T ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); HOT CARRIERS; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MODELS; VLSI CIRCUITS;

FULL BAND MONTE CARLO (FBMC) SIMULATION; HOT ELECTRON INDUCED DEGRADATION (HEID);

MOSFET DEVICES;

EID: 0032279148     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)