High speed moire contouring methods analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3520, Issue , 1998, Pages 27-35

  Harding, Kevin ^a   Bieman, Leonard ^a  

^a Michigan Manufacturing Technology Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; COLOR IMAGE PROCESSING; DATA REDUCTION; EDGE DETECTION; ERROR ANALYSIS; IMAGE ANALYSIS; IMAGE CODING; IMAGE QUALITY; IMAGE SEGMENTATION; INTERFEROMETRY; STEREO VISION; THREE DIMENSIONAL COMPUTER GRAPHICS;

HIGH SPEED MOIRE CONTOURING METHODS; IMAGE SPLITTING; MOIRE INTERFEROMETRY;

PATTERN RECOGNITION SYSTEMS;

EID: 0032278307     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (17)