Novel high-gain CMOS image sensor using floating N-well/gate tied PMOSFET

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1998, Pages 1023-1025

  Zhang, Weiquan ^a   Chan, Mansun ^a   Ko, Ping K ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; MOSFET DEVICES; OPTICAL SENSORS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR QUANTUM WELLS;

CMOS IMAGING CIRCUITS;

IMAGE SENSORS;

EID: 0032278089     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)