Hot-carrier effects in thin-film deep submicron SOI/MOSFET

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors

Volumn 19, Issue 4, 1998, Pages 280-286

  Cao, Jianmin ^a   Wu, Chuanliang ^a   Shen, Wenzheng ^a   Huang, Chang ^a  

^a Xi'an Lishan Micro Electronic Company   (China)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON ON INSULATOR TECHNOLOGY; THIN FILM DEVICES;

HOT CARRIER EFFECTS; TWO DIMENSIONAL SIMULATION;

MOSFET DEVICES;

EID: 0032276983     PISSN: 02534177     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)