SCOPUS 정보 검색 플랫폼

Volumn 33, Issue SUPPL. 2, 1998, Pages

Impact of incomplete ionization on indium doped buried channel pMOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032274775 PISSN: 03744884 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (4)

References (12)

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