Temperature field reconstruction by carrier electronic speckle pattern interferometry and computerized tomography

Guangxue Xuebao/Acta Optica Sinica

Volumn 18, Issue 1, 1998, Pages 95-98

  Li, Xide ^a   Wu, Xiaoping ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; OPTICAL SYSTEMS; SPECKLE; TEMPERATURE MEASUREMENT;

CARRIER ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; TEMPERATURE FIELD RECONSTRUCTION;

INTERFEROMETRY;

EID: 0032274303     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)