Ultrasonic force microscopy in waveguide mode up to 100 MHz

Proceedings of the IEEE Ultrasonics Symposium

Volumn 2, Issue , 1998, Pages 1255-1259

  Inagaki, K ^a   Kolosov, O V ^a   Briggs, G A D ^a   Muto, S ^a   Horisaki, Y ^a   Wright, O B ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; ELASTICITY; FREQUENCY MODULATION; IMAGE ANALYSIS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; SUBSTRATES; VIBRATIONS (MECHANICAL); WAVEGUIDES;

FLEXURAL ULTRASONIC VIBRATIONS; SCANNING PROBE MICROSCOPY; ULTRASONIC FORCE MICROSCOPY;

ULTRASONICS;

EID: 0032273891     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (17)