Sensing waffle in the Fried Geometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3353, Issue , 1998, Pages 964-971

  Oliker, Michael D ^a,b  

^a Adaptive Optics Associates   (United States)

^b NONE   (United States)

Author keywords

Adaptive optics; Fried Geometry; Noise gain; Waffle mode; Wavefront sensors

Indexed keywords

COMPUTATIONAL GEOMETRY; PHOTOLITHOGRAPHY; SENSORS; WAVEFRONTS; ADAPTIVE OPTICS; GEOMETRY; IMAGE RECONSTRUCTION; MIRRORS;

COMPUTATIONAL BURDENS; FRIED GEOMETRY; NEW SYSTEMS; NOISE GAIN; NOISE PROPAGATION; WAFFLE MODE; WAVEFRONT SENSORS; WAVEFRONT SENSOR;

OPTICAL SYSTEMS; OPTICAL SENSORS;

EID: 0032272880     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.321704     Document Type: Conference Paper

References (2)

1. Wild, W.J., Proc. SPIE 3126, 278, 1997
2. Oliker, M.D., Proc. SPIE 3126, 595, 1998