Extrapolations using vectorial planar near-field measurements for EMC applications

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 1998, Pages 924-928

  Nadeau, Benoit ^a   Laurin, Jean Jacques ^a  

^a Matrox   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; EXTRAPOLATION; METHOD OF MOMENTS; PRINTED CIRCUIT BOARDS; REGULATORY COMPLIANCE;

OPEN AREA TEST SITES (OATS);

ELECTROMAGNETIC COMPATIBILITY;

EID: 0032272398     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)