Development of APD measuring equipment and its faculty

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 1998, Pages 739-744

  Uchino, Masaharu ^a   Shinozuka, Takashi ^a   Sato, Risaburo ^a  

^a Research Lab Co Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRIC VARIABLES MEASUREMENT; LEAKAGE CURRENTS; MICROWAVE OVENS;

AMPLITUDE PROBABILITY DISTRIBUTION;

ELECTROMAGNETIC WAVE INTERFERENCE;

EID: 0032272393     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)