Customization of rapid visual reconnaissance technology for use within the deep sea - sediment profile imagery

Oceans Conference Record (IEEE)

Volumn 2, Issue , 1998, Pages 1115-1119

  Grehan, Anthony J ^a   McKillen, Mark ^a   Keegan, Brendan F ^a  

^a Martin Ryan Inst   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL ENGINEERING; GEOLOGICAL SURVEYS; IMAGING TECHNIQUES;

SEDIMENT PROFILE IMAGERY (SPI);

SEDIMENTS;

EID: 0032272301     PISSN: 01977385     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)