Improved stability of polysilicon thin-film transistors under self-heating and high endurance EEPROM cells for systems-on-panel

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1998, Pages 265-268

  Lee, Jin Woo ^a   Lee, Nae In ^a   Chung, Hoon Ju ^a   Han, Chul Hi ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; OSCILLATORS (ELECTRONIC); POLYCRYSTALLINE MATERIALS; PROM; QUARTZ; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; STRESSES; THERMAL EFFECTS;

ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY (EEPROM); SYSTEMS-ON-PANEL;

THIN FILM TRANSISTORS;

EID: 0032271794     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.1998.746351     Document Type: Conference Paper

References (6)