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Volumn 7, Issue 3, 1998, Pages 323-333

Reliable Fault Diagnosis with Few Tests

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EID: 0032271701     PISSN: 09635483     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0963548398003563     Document Type: Article
Times cited : (7)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.