Finite element analysis of AC loss in non-twisted Bi-2223 tape carrying AC transport current and/or exposed to DC or AC external magnetic field

Physica C: Superconductivity and its Applications

Volumn 310, Issue 1-4, 1998, Pages 30-35

  Amemiya, Naoyuki ^a   Miyamoto, Kengo ^a   Murasawa, Shun Ichi ^a   Mukai, Hideki ^b   Ohmatsu, Kazuya ^b  

^a YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

Finite element method; Flux penetration; Numerical analysis; Transport loss

Indexed keywords

CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC LOSSES; FINITE ELEMENT METHOD; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; MAGNETIZATION; OXIDE SUPERCONDUCTORS;

FLUX PENETRATION; TRANSPORT LOSS;

MAGNETIC TAPE;

EID: 0032270288     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(98)00428-6     Document Type: Article

References (4)

1. M. Ciszek, B.A. Glowacki, A.M. Campbell, S.P. Ashworth, W.Y. Liang, IEEE Trans. Appl. Superconduct. 7 (1997) 314.
2. S. Fukui, Y. Kitoh, T. Numata, O. Tsukamoto, J. Fujikami, K. Hayashi, Adv. Cryog. Eng. 44 (1998) to be published.
3. N. Amemiya, S. Murasawa, N. Banno, K. Miyamoto, in these Proceedings (Topical ICMC '98 AC Loss and Stability, 10-13 May 1998, Enschede, The Netherlands) Physica C 310 (1998) 16.
4. W.T. Norris, J. Phys. D (Applied Physics) 3 (1970) 489.