Polarization as a driving force in accelerated retention measurements on ferroelectric thin films

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 1998, Pages 15-18

  Traynor, S D ^a  

^a Ramtron International Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; FAILURE ANALYSIS; FERROELECTRIC MATERIALS; POLARIZATION; THERMAL EFFECTS; THIN FILMS; VECTORS;

ACCELERATED RETENTION MEASUREMENT; FERROELECTRIC THIN FILMS;

DIELECTRIC FILMS;

EID: 0032268899     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (0)