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Volumn , Issue , 1998, Pages 517-520
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New analytic models and efficient parameter extraction for computationally efficient 1-D and 2-D ion implantation modeling
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION IN SOLIDS;
ION IMPLANTATION;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DOPING;
ION IMPLANTATION MODELS;
CMOS INTEGRATED CIRCUITS;
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EID: 0032265926
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (5)
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