Defect imaging by micromachined ultrasonic air transducers

Proceedings of the IEEE Ultrasonics Symposium

Volumn 2, Issue , 1998, Pages 1003-1006

  Hansen, Sean ^a   Irani, Neville ^a   Degertekin, F Levent ^a   Ladabaum, Igal ^a   Khuri Yakub, B T ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BANDWIDTH; CAPACITORS; DEFECTS; SIGNAL TO NOISE RATIO; ULTRASONIC IMAGING; ULTRASONIC TESTING; ULTRASONIC TRANSMISSION;

CAPACITIVE MICROMACHINED ULTRASONIC TRANSDUCERS (CMUT); DEFECT IMAGING; PULSE ECHO IMAGING;

ULTRASONIC TRANSDUCERS;

EID: 0032265728     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)