Dielectric and pyroelectric properties of thin film PZT

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 1998, Pages 217-220

  Roeder, J F ^a   Chen, I S ^a   Van Buskirk, P C ^a   Betatan, H R ^a   Hanson, C M ^a  

^a Advanced Technology Materials Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; ELECTRODES; FERROELECTRIC MATERIALS; INFRARED DETECTORS; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; READOUT SYSTEMS; SILICON WAFERS; THIN FILMS;

READ OUT INTEGRATED CIRCUITS (ROIC);

DIELECTRIC FILMS;

EID: 0032264285     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (17)