Optical Properties of CuO Studied by Spectroscopic Ellipsometry

Journal of the Physical Society of Japan

Volumn 67, Issue 9, 1998, Pages 3304-3309

  Ito, Takayuki ^a   Yamaguchi, Hiroyuki ^a   Masumi, Taizo ^a,b   Adachi, Sadao ^a  

^a GUNMA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Absorption coefficient; Critical point; CuO; Dielectric function; Refractive index; Spectroscopic ellipsometry

Indexed keywords

EID: 0032261129     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.67.3304     Document Type: Article

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