Two-frequency phase-shifting projection moire topography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3520, Issue , 1998, Pages 36-42

  Kim, Seung Woo ^a   Oh, Jung Taek ^a   Jung, Moon Sik ^a   Choi, Yi Bae ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT REFLECTION; MOIRE FRINGES; OPTICAL VARIABLES MEASUREMENT; PHASE SHIFT;

THREE-DIMENSIONAL PROFILE MEASUREMENT; TWO-FREQUENCY PHASE SHIFTING PROJECTION MOIRE TOPOGRAPHY;

PROJECTION SYSTEMS;

EID: 0032260925     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)