Dependence of electrical properties of Pb(Zr,Ti)O3 thin films on the grain size and film thickness

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 1998, Pages 77-80

  Fujisawa, H ^a   Nakashima, S ^a   Shimizu, M ^a   Niu, H ^a  

^a UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL ELECTRODES; FERROELECTRIC MATERIALS; FILM GROWTH; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; POLARIZATION; THIN FILMS;

REMANENT POLARIZATION;

DIELECTRIC FILMS;

EID: 0032260099     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)