Deep submicron PHEMTs characterization with spectrally resolved carrier recombination imaging

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1998, Pages 239-242

  Wang, Z Y ^a   Qian, J Y ^a   Cheng, Li Jen ^a   Li, G P ^a   Chou, Y C ^a   Lai, R ^a   Streit, D C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC FIELDS; ELECTROLUMINESCENCE; GATES (TRANSISTOR); IMAGING TECHNIQUES; POLARIZATION;

SPECTRALLY RESOLVED CARRIER RECOMBINATION IMAGING;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0032257647     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)