Current distributions in multifilamentary conductors: The influence of intergrowths

Physica C: Superconductivity and its Applications

Volumn 310, Issue 1-4, 1998, Pages 159-162

  Volkozub, A V ^a   Caplin, A D ^a   Huang, Yibing ^b   Flukiger R ^c   Grasso, G ^c   Eckelmann, H ^d   Quilitz, M ^d   Goldacker, W ^d  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b GAP Biomédical   (Switzerland)

^c UNIVERSITY OF GENEVA   (Switzerland)

^d KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Bi 2223 tape; Current distribution; Hall sensor; Intergrowth

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC LEAKAGE; MATHEMATICAL MODELS; OXIDE SUPERCONDUCTORS; PROBES; REMANENCE;

HALL SENSOR; INTERGROWTH; MULTIFILAMENTARY TAPE;

MAGNETIC TAPE;

EID: 0032256158     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(98)00453-5     Document Type: Article

References (6)

1. M.D. Johnston, PhD Thesis, Imperial College, London, 1997.
2. C.P. Bean, Phys. Rev. Lett. 8 (1962) 250.
3. K.-H. Müller, Physica C 289 (1997) 123.
4. E.H. Brandt, M. Indenbom, Phys. Rev. B 48 (1993) 12983.
5. A.V. Volkozub, A.D. Caplin, Y. Huang, R. Flükiger, G. Grasso, H. Eckelmann, M. Quilitz, W. Goldacker, to be published.
6. M. Dhallé et al., to be published.