Monitoring a two-layer material by a thermo-emf method

Russian Journal of Nondestructive Testing

Volumn 34, Issue 10, 1998, Pages 746-749

  Lukhvich, A A ^a   Sharando, V I ^a   Novikov, S A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032253419     PISSN: 10618309     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. L. M. Suvorov, "A thermoelectric method of measuring electroplating thickness," Zavod. Lab., 30, No. 8, 959-962 (1964).
2. A. A. Lukhvich and V. I. Sharando, "Forecasting sensitivity in thermoelectric thickness gauging," Defektoskopiya, No. 10, 51-55 (1990).
3. A. A. Lukhvich and V. I. Sharando, "Effects of contact area and applied force on thermoelectric thickness gauging," Defektoskopiya, No. 12, 75-77 (1992).
4. A. A. Lukhvich, A. S. Karolik, and V. I. Sharando, The Structure Dependence of Thermoelectric parameters and Nondestructive Testing [in Russian], Nauka i Tekhnika, Minsk (1990).
5. A. A. Lukhvich and v. I. Sharando, "A thermoelectric method of monitoring metallic materials," Authors' Certificate 1548732 [in Russian], Byull. Izobret., No. 9 (1990).