-
2
-
-
0028467534
-
Characterization of an analytical electron microscope with a NiO test specimen
-
Egerton RF, Cheng SC (1994) Characterization of an analytical electron microscope with a NiO test specimen. Ultramicroscopy 55:43-54
-
(1994)
Ultramicroscopy
, vol.55
, pp. 43-54
-
-
Egerton, R.F.1
Cheng, S.C.2
-
3
-
-
2642675513
-
A standard procedure for the modeling of the decrease in detection efficiency with time for low-energy EDS spectra
-
Hovington P, L'Esperance G, Baril E, Rigaud M (1993) A standard procedure for the modeling of the decrease in detection efficiency with time for low-energy EDS spectra. Microbeam Anal 2:277-288
-
(1993)
Microbeam Anal
, vol.2
, pp. 277-288
-
-
Hovington, P.1
L'Esperance, G.2
Baril, E.3
Rigaud, M.4
-
4
-
-
0011163212
-
New measurements of the voltage dependence of absolute X-ray yields
-
Beaman DR, Ogilvie RE, Wittry DB (eds). Pendel
-
Lifshin E, Ciccarelli MF, Bolon R (1980) New measurements of the voltage dependence of absolute X-ray yields. In: Eighth International Congress on X-ray Optics and Microanalysis, Boston 1977, Beaman DR, Ogilvie RE, Wittry DB (eds). Pendel, pp 141-148
-
(1980)
Eighth International Congress on X-ray Optics and Microanalysis, Boston 1977
, pp. 141-148
-
-
Lifshin, E.1
Ciccarelli, M.F.2
Bolon, R.3
-
5
-
-
0003166111
-
X-ray design for microanalysis
-
Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press
-
Lowe BG (1995) X-ray design for microanalysis. In: X-Ray Spectrometry in Electron Beam Instruments, Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press, pp 7-19
-
(1995)
X-Ray Spectrometry in Electron Beam Instruments
, pp. 7-19
-
-
Lowe, B.G.1
-
6
-
-
0038611152
-
Current trends in Si(Li) detector windows for light element analysis
-
Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press
-
Lund M (1995) Current trends in Si(Li) detector windows for light element analysis. In: X-Ray Spectrometry in Electron Beam Instruments, Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press, pp 21-31
-
(1995)
X-Ray Spectrometry in Electron Beam Instruments
, pp. 21-31
-
-
Lund, M.1
-
7
-
-
0038611152
-
Improving EDS performance with digital pulse processing
-
Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press
-
Mott RB, Friel JJ (1995) Improving EDS performance with digital pulse processing. In: X-Ray Spectrometry in Electron Beam Instruments, Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press, pp 127-157
-
(1995)
X-Ray Spectrometry in Electron Beam Instruments
, pp. 127-157
-
-
Mott, R.B.1
Friel, J.J.2
-
8
-
-
12244253805
-
Artefacts in energy dispersive X-ray spectrometry
-
Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press
-
Newbury DE (1995) Artefacts in energy dispersive X-ray spectrometry. In: X-Ray Spectrometry in Electron Beam Instruments, Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press, pp 167-201
-
(1995)
X-Ray Spectrometry in Electron Beam Instruments
, pp. 167-201
-
-
Newbury, D.E.1
-
9
-
-
0012666994
-
Pile-up rejection: Limitations and corrections for residual errors in energy-dispersive spectrometers
-
Statham PJ (1977) Pile-up rejection: limitations and corrections for residual errors in energy-dispersive spectrometers. X-Ray Spectrom 6:94-103
-
(1977)
X-Ray Spectrom
, vol.6
, pp. 94-103
-
-
Statham, P.J.1
-
10
-
-
0019784306
-
X-ray microanalysis with Si(Li) detectors
-
Statham PJ (1981) X-ray microanalysis with Si(Li) detectors. J Microsc 123:1-23
-
(1981)
J Microsc
, vol.123
, pp. 1-23
-
-
Statham, P.J.1
-
11
-
-
0021374273
-
Accuracy, reproducibility and scope for X-ray microanalysis with Si(Li) detectors
-
Statham PJ (1984) Accuracy, reproducibility and scope for X-ray microanalysis with Si(Li) detectors. J Phys Colloque C2, suppl. 2:175-180
-
(1984)
J Phys Colloque
, vol.C2
, Issue.2 SUPPL.
, pp. 175-180
-
-
Statham, P.J.1
-
12
-
-
85034188370
-
Aspects of quantitative microanalysis of light elements by EDXS
-
Romig AD Jr, Chambers WF (eds). San Francisco: San Francisco Press
-
Statham PJ (1986) Aspects of quantitative microanalysis of light elements by EDXS. In: Microbeam Analysis-1986, Romig AD Jr, Chambers WF (eds). San Francisco: San Francisco Press, pp 281-284
-
(1986)
Microbeam Analysis-1986
, pp. 281-284
-
-
Statham, P.J.1
-
13
-
-
0026386064
-
Limitations and potential for EDX spectrometry in electron beam instruments
-
section 10, EMAG 91. Bristol: IOP Publishing
-
Statham PJ (1991) Limitations and potential for EDX spectrometry in electron beam instruments. In: Institute of Physics Conference Series 119, section 10, EMAG 91. Bristol: IOP Publishing, pp 425-432
-
(1991)
Institute of Physics Conference Series 119
, pp. 425-432
-
-
Statham, P.J.1
-
14
-
-
0038611152
-
Quantifying benefits of resolution and count rate in EDX microanalysis
-
Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press
-
Statham PJ (1995) Quantifying benefits of resolution and count rate in EDX microanalysis. In: X-Ray Spectrometry in Electron Beam Instruments, Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press, pp 101-126
-
(1995)
X-Ray Spectrometry in Electron Beam Instruments
, pp. 101-126
-
-
Statham, P.J.1
-
15
-
-
0006176282
-
Recent developments in instrumentation for X-ray microanalysis
-
Proc. EMAS'97, Torquay, UK 1998
-
Statham PJ (1998) Recent developments in instrumentation for X-ray microanalysis. In: Proc. EMAS'97, Torquay, UK (Also Mikrochimi Acta) (Suppl 15):1-9, 1998
-
(1998)
Mikrochimi Acta
, Issue.15 SUPPL.
, pp. 1-9
-
-
Statham, P.J.1
-
16
-
-
4243493350
-
High resolution nondispersive X-ray spectrometery with state-of-the-art silicon detectors
-
Struder L (1998) High resolution nondispersive X-ray spectrometery with state-of-the-art silicon detectors. Mikrochim Acta (Suppl 15):10-19
-
(1998)
Mikrochim Acta
, Issue.15 SUPPL.
, pp. 10-19
-
-
Struder, L.1
-
17
-
-
0031474227
-
High resolution, energy-dispersive microcalorimeter spectrometer for X-ray microanalysis
-
Wollman DA, Irwin KD, Hilton GC, Dulcie LL, Newbury DE, Martinis JM (1997) High resolution, energy-dispersive microcalorimeter spectrometer for X-ray microanalysis. J Microsc 188:196-223
-
(1997)
J Microsc
, vol.188
, pp. 196-223
-
-
Wollman, D.A.1
Irwin, K.D.2
Hilton, G.C.3
Dulcie, L.L.4
Newbury, D.E.5
Martinis, J.M.6
-
18
-
-
84892802899
-
Characterizing an energy dispersive spectrometer on an analytical electron microscope
-
Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press
-
Zemyan SM, Williams DB (1995) Characterizing an energy dispersive spectrometer on an analytical electron microscope. In: X-Ray Spectrometry in Electron Beam Instruments, Williams DB, Goldstein JI, Newbury DE (eds). New York: Plenum Press, pp 203-219
-
(1995)
X-Ray Spectrometry in Electron Beam Instruments
, pp. 203-219
-
-
Zemyan, S.M.1
Williams, D.B.2
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