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Volumn 43 Suppl, Issue , 1998, Pages 400-406

Micromorphometry and stereography of rough depth relief coated implant surfaces by scanning electron microscopy and confocal laser scanning microscopy;Mikromorphometrie und Stereographie des Rauhtiefenreliefs beschichteter Implantatoberflächen durch Rasterelektronenmikroskopie und konfokale Laser-Scanning Mikroskopie.

Author keywords

[No Author keywords available]

Indexed keywords

BIOMATERIAL;

EID: 0032246327     PISSN: 00135585     EISSN: None     Source Type: Journal    
DOI: 10.1515/bmte.1998.43.s1.400     Document Type: Article
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.