Quantitation of major elements with secondary ion mass spectrometry by using M2+-molecular ions

Journal of the American Society for Mass Spectrometry

Volumn 9, Issue 6, 1998, Pages 638-642

  Vlekken, J ^a   Wu, T D ^a   D'Olieslaeger, M ^a   Knuyt, G ^a   Vandervorst, W ^a   De Schepper, L ^a  

^a HASSELT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ELEMENT; GALLIUM; ION;

SPECTROMETRY;

ANALYTIC METHOD; ARTICLE; CONTROLLED STUDY; ENERGY; INSTRUMENT; MASS SPECTROMETRY; MOLECULE; QUANTITATIVE ANALYSIS; TECHNIQUE;

EID: 0032231996     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-0305(98)00028-2     Document Type: Article

References (10)