Novel cell isolation technique for the analysis of CMOS SRAM cell cold failure

IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

Volumn , Issue , 1998, Pages 64-69

  Lim, Yit Wooi ^a   Yeoh, Teong San ^a  

^a Intel Technology Malaysia Sdn Bhd   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; FAILURE ANALYSIS; LEAKAGE CURRENTS; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR STORAGE; THRESHOLD VOLTAGE; TRANSISTORS;

CELL ISOLATION; STATIC RANDOM ACCESS STORAGE (SRAM);

RANDOM ACCESS STORAGE;

EID: 0032231544     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (1)