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Volumn 1998-March, Issue , 1998, Pages 29-32
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Advances in flip chip underfill material cure rates and reliability
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Author keywords
[No Author keywords available]
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Indexed keywords
CHIP SCALE PACKAGES;
CURING;
DIFFERENTIAL SCANNING CALORIMETRY;
GLASS TRANSITION;
INTERFACES (MATERIALS);
PACKAGING MATERIALS;
RELIABILITY;
THERMAL EXPANSION;
FLIP CHIP DEVICES;
MOISTURE DETERMINATION;
PLASTICS FILLERS;
SHEAR STRENGTH;
TEMPERATURE;
TEMPERATURE MEASUREMENT;
TIME MEASUREMENT;
VISCOSITY;
CURE TEMPERATURE;
FUNCTION OF TIME;
LINEAR COEFFICIENT OF THERMAL EXPANSION;
MOISTURE ABSORPTION RATES;
RELIABILITY DATA;
SEMICONDUCTOR PACKAGING;
THERMOMECHANICAL ANALYZERS;
UNDERFILL MATERIALS;
FLIP CHIP DEVICES;
ELECTRONICS PACKAGING;
COEFFICIENT OF THERMAL EXPANSION;
CURE RATES;
FLIP CHIP UNDERFILLS;
MOISTURE ABSORPTION;
THERMOMECHANICAL ANALYZER;
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EID: 0032230670
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISAPM.1998.664429 Document Type: Conference Paper |
Times cited : (2)
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References (3)
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