Reliability of amorphous silicon thin film transistors for LCD under DC and AC stresses

International Conference on Solid-State and Integrated Circuit Technology Proceedings

Volumn , Issue , 1998, Pages 834-837

  Cheng, Huang Chung ^a   Huang, Chun Yao ^a   Lin, Jing Wei ^a   Kung, Jerry Ji Ho ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CHARGE CARRIERS; CHARGE TRANSFER; CRYSTAL DEFECTS; ELECTRIC FIELD EFFECTS; ELECTRON TRANSITIONS; ELECTRON TRAPS; HYDROGENATION; LIQUID CRYSTAL DISPLAYS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; STRESSES;

CHARGE TRAPPING;

THIN FILM TRANSISTORS;

EID: 0032226736     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (16)