|
Volumn , Issue , 1998, Pages 127-130
|
Investigation of KOH anisotropic etching of Si 〈100〉 wafers for improving etched surface quality
a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ANISOTROPY;
CRYSTAL ORIENTATION;
ETCHING;
MASKS;
POTASSIUM COMPOUNDS;
SILICON NITRIDE;
SOLUTIONS;
SILICON MEMBRANE ETCHING;
SILICON WAFERS;
|
EID: 0032226667
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
|
References (4)
|