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Volumn , Issue , 1998, Pages 101-108
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Reliability of reprogrammable nonvolatile memories
a
a
SST Inc
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
CELLULAR ARRAYS;
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
COMPUTER SOFTWARE;
DURABILITY;
ELECTRON TUNNELING;
ITERATIVE METHODS;
LOGIC GATES;
RELIABILITY;
DATA RETENTION PARAMETERS;
ERASE PROGRAM METHODS;
FLOATING GATE STORAGE NODES;
HIGH VOLTAGE SIGNALS;
REPROGRAMMABLE NOVOLATILE MEMORIES;
NONVOLATILE STORAGE;
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EID: 0032226484
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (7)
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References (5)
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