Spatial and electronic manipulation of silicon nanocrystals by atomic force microscopy

Biennial IEEE International Nonvolatile Memory Technology Conference

Volumn , Issue , 1998, Pages 77-

  Bell, L Douglas ^a   Santamore, Deborah H ^a   Boer, Elizabeth A ^a   Atwater, Harry A ^a   Vahala, Kerry J ^a   Flagan, Richard C ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRIC FIELD EFFECTS; ELECTRON TRANSPORT PROPERTIES; MOS DEVICES; NANOSTRUCTURED MATERIALS; OXIDES; PARTICLE SIZE ANALYSIS; SILICON; THICKNESS CONTROL;

AEROSOL VAPOR SYNTHESIS; FLOATING GATE MEMORIES; SCANNING PROBE TECHNIQUES; SILICON NANOCRYSTALS;

NONVOLATILE STORAGE;

EID: 0032226480     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)