Quantum efficiency of x-ray CCDs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3301, Issue , 1998, Pages 108-115

  Prigozhin, G ^a   Woo, J ^a   Gregory, J A ^a   Loomis, A H ^a   Bautz, M W ^a   Ricker, G R ^a   Kraft, S ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Charge coupled devices (CCD); X ray absorption fine structure (XAFS); X rays

Indexed keywords

DOPING (ADDITIVES); ENERGY ABSORPTION; PHOSPHORUS; POLYSILICON; QUANTUM EFFICIENCY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICE STRUCTURES; SILICA; SILICON NITRIDE; THIN FILMS; X RAYS;

ENERGY TRANSMISSION; X RAY ABSORPTION FINE STRUCTURES;

CHARGE COUPLED DEVICES;

EID: 0032225436     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.304552     Document Type: Conference Paper

References (4)

1. Advanced X-ray astrophysics facility (AXAF) - An overview
2. X-ray multi-mirror mission - An overview
3. Absolute measurement of oxygen edge structure in the quantum efficiency of X-ray CCDs
4. Soft X-ray imagers for AXAF