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Volumn 3271, Issue , 1998, Pages 104-113

High resolution photoelectron images and D+ photofragment images following 532-nm photolysis of D2

Author keywords

532 nm laser light; Above threshold ionization; Bond softening; D2 Photolysis; Ion Imaging; Velocity Mapping

Indexed keywords

DEUTERIUM; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; LASER BEAM EFFECTS; PHOTODISSOCIATION; PHOTOIONIZATION;

PHOTOELECTRON IMAGES; PHOTOFRAGMENT IMAGES; VELOCITY MAPPING;

PHOTOLYSIS;

EID: 0032225239 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.308400 Document Type: Conference Paper

Times cited : (10)

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