Monte-Carlo model for describing charge transfer in irradiated CCDs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3301, Issue , 1998, Pages 80-88

  Gallagher, Dennis ^a   Demara, Raymond ^a   Emerson, Gary ^a   Frame, Wayne ^a   Delamere, Alan ^a  

^a BALL AEROSPACE AND TECHNOLOGIES CORP   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; COMPUTER SIMULATION; ELECTRON TRAPS; MONTE CARLO METHODS; PROTON IRRADIATION; RADIATION DAMAGE; SPACE APPLICATIONS;

CHARGE TRANSFER INEFFICIENCY; RADIATION INDUCED TRAPS; SHOCKLEY-READ-HALL GENERATION-RECOMBINATION THEORY; STAR TRACKER;

CHARGE COUPLED DEVICES;

EID: 0032224740     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.304563     Document Type: Conference Paper

References (4)

1. The effects of bulk traps on the performance of bulk channel charge-coupled devices