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Volumn 3301, Issue , 1998, Pages 131-138

EB-CCD life characteristics

Author keywords

EB CCD; Electron tube; Life; Low light level imaging; Multi pinned phase operation; Photocathode; X ray

Indexed keywords

CHARGE TRANSFER; ELECTRON TUBES; GAIN MEASUREMENT; INTERFACES (MATERIALS); ION BOMBARDMENT; PHOTOCATHODES; RADIATION DAMAGE; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE TESTING; SENSITIVITY ANALYSIS; X RAYS;

EID: 0032224325     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.304555     Document Type: Conference Paper
Times cited : (1)

References (6)
  • 4
    • 0029193598 scopus 로고
    • Electron-bombarded back-illuminated CCD sensors for low light level imaging application
    • (1995) SPIE , vol.2415 , pp. 211-235
    • Williams G.M., Jr.1
  • 5
    • 0029513655 scopus 로고
    • Back-illuminated and electron-bombarded CCD low light level imaging system performance
    • (1995) SPIE , vol.2551 , pp. 208-223
    • Williams G.M., Jr.1
  • 6
    • 84957503941 scopus 로고
    • Charge-coupled device pinning technologies
    • (1989) SPIE , vol.1071 , pp. 153-169
    • Janesick, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.