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Volumn 3301, Issue , 1998, Pages 131-138
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EB-CCD life characteristics
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Author keywords
EB CCD; Electron tube; Life; Low light level imaging; Multi pinned phase operation; Photocathode; X ray
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Indexed keywords
CHARGE TRANSFER;
ELECTRON TUBES;
GAIN MEASUREMENT;
INTERFACES (MATERIALS);
ION BOMBARDMENT;
PHOTOCATHODES;
RADIATION DAMAGE;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR DEVICE TESTING;
SENSITIVITY ANALYSIS;
X RAYS;
BREMSSTRAHLUNG X RAY;
DARK CURRENT;
ELECTRON BOMBARDMENT;
FULL FRAME TRANSFER;
MULTI-PINNED PHASE OPERATION;
CHARGE COUPLED DEVICES;
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EID: 0032224325
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.304555 Document Type: Conference Paper |
Times cited : (1)
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References (6)
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