Shear ESPI with small-objects

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3407, Issue , 1998, Pages 332-337

  Sirohi, R S ^a   Tay, C J ^a   Shang, H M ^a   Boo, W P ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; PHASE SHIFT; PHOTOGRAPHY; SHEAR DEFORMATION; SPECKLE;

DIGITAL SPECKLE SHEAR INTERFEROMETRY (DSI);

INTERFEROMETRY;

EID: 0032224226     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.323336     Document Type: Conference Paper

References (14)

1. Electronic speckle pattern interferometric measurements of the basilar membrane in the inner year
2. Inspection of out-of-plane movements over small areas using electronic speckle pattern interferometry
3. The use of electronic speckle pattern interferometry (ESPI) in the crack propagation analysis of epoxy resins
4. A speckle shearing interferometer
5. Shearography: A new optical method for strain measurement and nondestructive testing
6. Shearography: A novel and practical approach for nondestructive inspection
7. Speckle shear interferometry
8. A real-time digital shearing speckle interferometer
9. Computer-aided electronic speckle pattern interferometry (ESPI): Deformation analysis by fringe manipulation