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Volumn 3426, Issue , 1998, Pages 81-95
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Surface electromagnetic waves in near-field optical scanning microscopy
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC PROPERTIES;
ELECTROMAGNETIC FIELDS;
ELECTROMAGNETIC WAVE PROPAGATION;
FOURIER TRANSFORMS;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
OPTICAL RESOLVING POWER;
RAYLEIGH SCATTERING;
SURFACE WAVES;
SURFACE ELECTROMAGNETIC WAVES;
ELECTROMAGNETIC WAVES;
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EID: 0032224155
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.328443 Document Type: Conference Paper |
Times cited : (1)
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References (9)
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