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Volumn 3407, Issue , 1998, Pages 133-140
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Roughness parameters and surface deformation measured by "coherence radar"
a a a a a |
Author keywords
Coherence radar; Deformation measurement; Rough surfaces; Roughness; Surface topology; White light interferometry
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Indexed keywords
DATA ACQUISITION;
DEFORMATION;
FOURIER TRANSFORMS;
INTERFEROMETRY;
RADAR SYSTEMS;
SPECKLE;
STATISTICAL METHODS;
COHERENCE RADAR;
MICROTOPOGRAPHY;
SURFACE ROUGHNESS;
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EID: 0032224141
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.323304 Document Type: Conference Paper |
Times cited : (17)
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References (7)
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